actively caters to both academic and industrial interests. Fostering
collaboration between universities and industry, it allows for interactions
which traverse the traditional boundaries between science, engineering
and medicine, truly creating partnerships for innovative research.
At the heart of the facility are leading edge capabilities in two
major complimentary surface analytical techniques, namely:
- X-ray Photoelectron Spectroscopy (XPS)
- Time-of-Flight Secondary Ion Mass Spectroscopy (ToFSIMS)
These techniques are well established; however, recent advances
in instrumentation have made these techniques even more powerful.
In addition, SI-Ontario
- Surface profilometry
- Cryo-ultramicrotome and other sample preparation techniques
- Versatile preparation/reaction chambers
- Vacuum/cryo suitcase for sample transfer
- Liaison with other nearby University facilities utilising related
and complementary techniques
provides a complete environment for many surface science studies
as well as in meeting the surface analytical needs of a majority
of those involved with advanced materials research.