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Surface Interface Ontario allows scientists and engineers ready access to modern surface analytical equipment, providing enabling information to the many disciplines involved in advanced materials research. Evolving from the Surface Science Unit of the Institute of Biomaterial and Biomedical Engineering (IBBME), it relocated into newly renovated laboratory and office space within the Department of Chemical Engineering & Applied Chemistry at the University of Toronto in Spring 2002. Further CFI funding (as part of their Leading Edge Fund) in 2006 has allowed for further expansion providing leading edge capabilities in several areas of surface analysis.

Surface Interface Ontario actively caters to both academic and industrial interests. Fostering collaboration between universities and industry, it allows for interactions which traverse the traditional boundaries between science, engineering and medicine, truly “creating partnerships for innovative research”.

At the heart of the facility are leading edge capabilities in two major complimentary surface analytical techniques, namely:

  • X-ray Photoelectron Spectroscopy (XPS)
  • Time-of-Flight Secondary Ion Mass Spectroscopy (ToFSIMS)

These techniques are well established; however, recent advances in instrumentation have made these techniques even more powerful.

In addition, SI-Ontario offers:

  • Surface profilometry
  • Cryo-ultramicrotome and other sample preparation techniques
  • Versatile preparation/reaction chambers
  • Vacuum/cryo “suitcase” for sample transfer
  • Liaison with other nearby University facilities utilising related and complementary techniques

Thus SI-Ontario provides a complete environment for many surface science studies as well as in meeting the surface analytical needs of a majority of those involved with advanced materials research.